SEM Scanning Electron Microscope - translation to Αγγλικά
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SEM Scanning Electron Microscope - translation to Αγγλικά

TYPE OF TRANSMISSION ELECTRON MICROSCOPE
Scanning transmission electron microscope; Scanning Transmission Electron Microscope; S/TEM; Scanning Transmission Electron Microscopy; Scanning-transmission electron microscope; STEM study
  • Inside the aberration corrector ([[hexapole]]-hexapole type)
  • STEM-DPC imaging of Fe<sub>60</sub>Al<sub>40</sub>, where the spiral structure is ferromagnetic, and the surrounding region is non-magnetic
  • Schematic of STEM mode
  • Atomic resolution imaging of SrTiO<sub>3</sub>, using annular dark field (ADF) and annular bright field (ABF) detectors. Overlay: strontium (green), titanium (grey) and oxygen (red)
  • An ultrahigh-vacuum STEM equipped with a 3rd-order spherical aberration corrector
  • Schematic of differential phase contrast imaging, with the beam being deflected by a magnetic field in the material
  • Schematic of a STEM with aberration corrector

SEM Scanning Electron Microscope      
SEM Scanning Electron Microscope noun сканирующий электронный микроскоп
scanning electron microscope         
  • Electron–matter interaction volume and types of signal generated
  • Mechanisms of emission of secondary electrons, backscattered electrons, and characteristic X-rays from atoms of the sample
  • M. von Ardenne's]] first SEM
  • A spider sputter-coated in gold, having been prepared for viewing with an SEM
  • Low-temperature SEM magnification series for a [[snow]] crystal. The crystals are captured, stored, and sputter-coated with platinum at cryogenic temperatures for imaging.
  • Low-voltage micrograph (300&nbsp;V) of distribution of adhesive droplets on a [[Post-it note]]. No conductive coating was applied: such a coating would alter this fragile specimen.
  • Comparison of SEM techniques: <br />Top: backscattered electron analysis{{snd}} composition <br /> Bottom: secondary electron analysis{{snd}} topography
  • A video illustrating a typical practical magnification range of a scanning electron microscope designed for biological specimens. The video starts at 25×, about 6 mm across the whole field of view, and zooms in to 12000×, about 12&nbsp;[[μm]] across the whole field of view. The spherical objects are glass beads with a diameter of 10&nbsp;μm, similar in diameter to a [[red blood cell]].
  • SEM with opened sample chamber
  • Analog type SEM
  • Operating principle of a Scanning Electron Microscope (SEM)
  • Schematic of an SEM
  • Schottky-emitter electron source
TYPE OF ELECTRON MICROSCOPE
Scanning Electron Microscope; Scanning electron microscopy; Scanning electron micrograph; Microscopy, electron, scanning; Scanning Electron Microscopy; FESEM; Fegsem; SEM study; Scanning electron; Scanning electron microscopes; Scanning electron microscopies; Scanning Electron Micrograph; 3D SEM surface reconstruction; 3D reconstruction of SEM images; Scanning electron micrographs; Ion-abrasion SEM; History of scanning electron microscopy; Interaction volume

общая лексика

растровый [сканирующий] электронный микроскоп

scanning electron microscopy         
  • Electron–matter interaction volume and types of signal generated
  • Mechanisms of emission of secondary electrons, backscattered electrons, and characteristic X-rays from atoms of the sample
  • M. von Ardenne's]] first SEM
  • A spider sputter-coated in gold, having been prepared for viewing with an SEM
  • Low-temperature SEM magnification series for a [[snow]] crystal. The crystals are captured, stored, and sputter-coated with platinum at cryogenic temperatures for imaging.
  • Low-voltage micrograph (300&nbsp;V) of distribution of adhesive droplets on a [[Post-it note]]. No conductive coating was applied: such a coating would alter this fragile specimen.
  • Comparison of SEM techniques: <br />Top: backscattered electron analysis{{snd}} composition <br /> Bottom: secondary electron analysis{{snd}} topography
  • A video illustrating a typical practical magnification range of a scanning electron microscope designed for biological specimens. The video starts at 25×, about 6 mm across the whole field of view, and zooms in to 12000×, about 12&nbsp;[[μm]] across the whole field of view. The spherical objects are glass beads with a diameter of 10&nbsp;μm, similar in diameter to a [[red blood cell]].
  • SEM with opened sample chamber
  • Analog type SEM
  • Operating principle of a Scanning Electron Microscope (SEM)
  • Schematic of an SEM
  • Schottky-emitter electron source
TYPE OF ELECTRON MICROSCOPE
Scanning Electron Microscope; Scanning electron microscopy; Scanning electron micrograph; Microscopy, electron, scanning; Scanning Electron Microscopy; FESEM; Fegsem; SEM study; Scanning electron; Scanning electron microscopes; Scanning electron microscopies; Scanning Electron Micrograph; 3D SEM surface reconstruction; 3D reconstruction of SEM images; Scanning electron micrographs; Ion-abrasion SEM; History of scanning electron microscopy; Interaction volume

медицина

сканирующая электронная микроскопия

нефтегазовая промышленность

сканирующая электронная микроскопия (для анализа керна)

Ορισμός

сем
СЕМ, сем-ка, сем-ко, а ну, давай, ну-ка, пойдем, начнем, станем. Сем пойду к куме. Сем-ка подумаем.
| Сем или быть, ·*ряз. да, так, конечно. Семкать, звать, приглашать, понукать, говорить: сем-ка, ну-ка. Сём, пересём, как бы день прошел. Семьяк, сем-як, ·*арх.-мез. сюда, по сю сторону. Клади сем-як, туда-як неладно.
II. СЕМ вместо сим. То тем, то сем промышляет. Семо церк. сюда. Приведите его семо, Матф. Семо и овамо, или ·стар. семь и семь, туда и сюда.

Βικιπαίδεια

Scanning transmission electron microscopy

A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 – 0.2 nm) which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis. The rastering of the beam across the sample makes STEM suitable for analytical techniques such as Z-contrast annular dark-field imaging, and spectroscopic mapping by energy dispersive X-ray (EDX) spectroscopy, or electron energy loss spectroscopy (EELS). These signals can be obtained simultaneously, allowing direct correlation of images and spectroscopic data.

A typical STEM is a conventional transmission electron microscope equipped with additional scanning coils, detectors, and necessary circuitry, which allows it to switch between operating as a STEM, or a CTEM; however, dedicated STEMs are also manufactured.

High-resolution scanning transmission electron microscopes require exceptionally stable room environments. In order to obtain atomic resolution images in STEM, the level of vibration, temperature fluctuations, electromagnetic waves, and acoustic waves must be limited in the room housing the microscope.

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